接点

zài cè shì shí liú guo jiē diǎn de diàn liú guò dà yě néng shǐ jiē chù qū yù fā shēng xì wēi de wù lǐ biàn huà

在测试时流过接点的电流过大也能使接触区域发生细微的物理变化。

Excessive current through the contacts during testing can cause a physical change in the contact area on a microscopic level.